National Stock Number
6625-01-152-1697
National Stock Number (NSN) 6625-01-152-1697, or NIIN 011521697, (test set,semiconductor device) was assigned April 28, 1983 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.
There is only one manufacturer part number associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by one supplier. Today, there are no suppliers listed as an Active supplier for this NSN. Of the active suppliers, there are no suppliers that are deemed design controlled or valid supply parts.
This part number has not been procured by the US Government in over 5 years.
Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Sep 02, 2000, this NSN's acquisition method was noted as: Suitable for competitive acquisition for the first time. (Potential sources shall include dealers/distributors.) This part is a commercial/non-developmental/off-the-shelf-item. Valid AMCs: 1, 2, 3, 4 and 5.
This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625011521697 does not contain precious metals.
This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.
This information was last updated on Nov 01, 2024.