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NSN 5962-01-128-3301, 5962011283301
MICROCIRCUIT,MEMORY

Federal Supply Classification
FSC 5962 - Microcircuits, Electronic
National Item Identification Number
NIIN 011283301
Codification Country
United States
Item Name Code
INC 41015
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(N) There is no data in the HMIRS and the NSN is in an FSC not generally suspected of containing hazardous materials.
Availability: Readily Available Qualified Suppliers: Currently qualifying suppliers

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DLMS® Summary

National Stock Number 5962-01-128-3301

National Stock Number (NSN) 5962-01-128-3301, or NIIN 011283301, (microcircuit,memory) was assigned March 20, 1982 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 6 manufacturer part numbers associated with this NSN. 2 of those part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 4 suppliers. Today, 2 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

This NSN is somewhat common among different platforms, belonging to 3 different weapons systems.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Aug 02, 2006, this NSN's acquisition method was noted as: Suitable for Competitive Acquisition. (Potential sources shall include dealers/distributors.) This part requires engineering source approval by the design control activity in order to maintain the quality of the part. An alternate source must qualify in accordance with the design control activity's procedures, as approved by the cognizant Government engineering activity. Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 41015. [A CIRCUIT DESIGNED TO STORE INFORMATION AND/OR CODED INSTRUCTIONS. ITEM HAS PINS OR OTHER CONNECTIONS TO INSTALL IN A COMPUTER OR COMPUTING DEVICE. DOES NOT INCLUDE MAGNETIC DRUMS, TAPES, PUNCHED CARDS OR THE LIKE. FOR ITEMS THAT HAVE PORTABLE TYPE CONNECTIONS SEE MEMORY, PORTABLE, SOLID STATE.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no data in the HMIRS and the NSN is in an FSC not generally suspected of containing hazardous materials. NSN 5962011283301 does not contain precious metals.

This NSN is associated to Schedule B 8542900000: electronic integrated circuits and microassembly parts. The Schedule B End Use is listed as semiconductors. NAICS classification category 334413: semiconductor and related device manufacturing.

This information was last updated on .


Technical Characteristics

OPERATING TEMP RANGE
(AFGA) -55.0 TO 125.0 DEG CELSIUS
STORAGE TEMP RANGE
(AFJQ) -65.0 TO 150.0 DEG CELSIUS
STORAGE TEMP RANGE
(AFJQ) -65.0/+150.0 DEG CELSIUS
OPERATING TEMP RANGE
(AFGA) -55.0/+125.0 DEG CELSIUS
BODY HEIGHT
(ADAU) 0.200 INCHES MAXIMUM
BODY LENGTH
(ADAQ) 0.930 INCHES MAXIMUM
BODY WIDTH
(ADAT) 0.295 INCHES MAXIMUM
FEATURES PROVIDED
(CBBL) HERMETICALLY SEALED AND BURN IN AND W/ENABLE AND PROGRAMMABLE AND BIPOLAR
INCLOSURE CONFIGURATION
(CQSZ) DUAL-IN-LINE
INCLOSURE MATERIAL
(CQSJ) CERAMIC
INPUT CIRCUIT PATTERN
(CQZP) 12 INPUT
OPERATING TEMP RANGE
(AFGA) -55.0 TO 125.0 CELSIUS
OUTPUT LOGIC FORM
(CQWX) TRANSISTOR-TRANSISTOR LOGIC
MEMORY CAPACITY
(CZZZ) UNKNOWN
MEMORY DEVICE TYPE
(CZER) ROM
VOLTAGE RATING AND TYPE PER CHARACTERISTIC
(CZEN) 7.0 VOLTS MAXIMUM POWER SOURCE
STORAGE TEMP RANGE
(AFJQ) -65.0 TO 150.0 CELSIUS
TERMINAL TYPE AND QUANTITY
(TTQY) 18 PRINTED CIRCUIT
TERMINAL SURFACE TREATMENT
(CWSG) SOLDER
TEST DATA DOCUMENT
(TEST) 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
TIME RATING PER CHACTERISTIC
(CZEQ) 125.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 125.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT

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